PRICE
- Q-Test charge monitor wafer process, (Patent Pending) allows real product representation at a reduced cost.
- Charge damage testing is quick and easy to analyze for reduced cost.
REAL PRODUCT REPRESENTATION
- Thin dielectric areas as large as 50,000µ2
- Configured to match real wafer "in process" conditions.
- Customer
thin dielectric films can be formed on Q-Test wafers for charge damage
evaluation.
DATA RELIABILITY
- Q-Test wafer provides relevant end product test results.
- Customized wafer conditions represent real wafer situations.
- Charge damage assessment sensitivity amplified as much as 106.
webmaster@tfiwafer.com
Copyright TFI 1999